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NEW Products!

EDAX Inc. continues to advance materials characterization, while raising the standard with speed and accuracy with its new products.

Orbis Micro-XRF Spectrometer
Building on more than 10 years of Micro-XRF experience, the Orbis Spectrometer  yields a system with excellent Micro-XRF capability while setting a new standard in analytical flexibility. The Orbis incorporates a unique motorized turret integrating video and X-ray optics allowing coaxial sample view and X-ray analysis. Primary beam filters can be used with a variety of X-ray optics to allow true XRF analytical capabilities in a micro-spot analysis. The working distance is increased to allow analysis over a rougher sample topography without sacrificing signal intensity. Two additional X-ray collimators can be added to the optical turret for a total of three X-ray beam sizes to expand the Orbis analytical capabilities beyond traditional Micro-XRF analysis.

All this analytical flexibility is packaged into a table-top unit with powerful, easy-to-use analysis software. Orbis users can make elemental analyses on small samples such as particles, fragments and inclusions, or automated multi-point and elemental imaging analysis on larger samples with all the benefits and simplicity of an XRF analyzer. Benefits include:
                    
• Non-destructive measurement

• Minimal sample preparation (e.g. no sample coating is necessary)

• Improved sensitivity for many elements in comparison to SEM/EDS

• Inclusion and coating thickness analysis with the penetrating power
   of X-rays

• Analysis of wet samples

Genesis Apex 2
In order to generate accurate X-ray microanalysis data, solid foundations are of the utmost importance.   The foundations include the detector, digital pulse processing electronics and analytical software. The Genesis Apex 2 improves all aspects of these foundations, building on over 45 years of experience as the technology leader for EDS X-ray microanalysis.  The Genesis Apex 2 system is designed around the latest in silicon drift detector (SDD) chip technology in the Apollo SDD series, new innovative digital pulse processing electronics, DPP III, and analytical software via the latest additions available in Version 6 of the market leading EDS software, Genesis.

Genesis Apex 4
Advanced X-ray microanalysis data requires a solid foundation. Genesis Apex 4 is built upon improvements in the SDD, digital pulse processing electronics and analytical software to strengthen the foundation. The Genesis Apex 4 is a product of EDAX's 45 years of experience as the EDS X-ray microanalysis technology leader. The Genesis Apex 4 system is designed around the latest in silicon drift detector (SDD) chip technology in the Apollo SDD series, new innovative digital pulse processing electronics, DPP III, and analytical software via the latest additions available in Version 6 of the market leading EDS software, Genesis. Genesis Apex 4 provides a platform for the advanced materials scientist, offering the opportunity for complex particle analysis, multiple detector capability and expandability for seamless integration with EDAX's EBSD and WDS materials characterization product line.

DigiView IV Detector
DigiView IV is the latest member of the EDAX Electron Backscatter Diffraction (EBSD) series of detectors and is designed to serve a range of EBSD applications.

Using the DigiView IV in combination with EDAX’s OIM™ software, the detector can obtain orientation mapping data at rates up to 150 indexed patterns per second with indexing success rates of greater than 99%. The DigiView IV can also be used for Phase Identification using the Genesis and Delphi software applications. The detector can produce high resolution images up to 1392 x 1040 pixels.

Apollo Silicon Drift Detector
The Apollo SDD LN2 free EDS detectors are based on the latest silicon drift chamber technologies utilizing EDAX's state of the art electronics and seamlessly interface with the market leading Genesis software. The collection efficiency of the SDD, coupled with the light element and resolution performance provide the Genesis software with data ideal for qualitative and quantitative analysis leading to results with confidence.

Hikari
The new Hikari high speed EBSD detector continues EDAX-TSL's tradition of pioneering EBSD technology. Hikari is a full featured, completely integrated CCD-based detector that excels at all EBSD applications, whether they require speed and sensitivity or signal to noise performance. Hikari provides the fastest EBSD pattern acquisition rate available and can achieve simultaneous acquisition and indexing speeds of 450 patterns per second for many materials. The accuracy and efficiency of the Hikari makes it an ideal analytical tool for research, materials characterization, and production laboratory environments. The Hikari is also ideal for Insitu testing experiments, utilizing heating and tensile stages and 3D EBSD using an ion-electron beam SEM.

Pegasus, Neptune, and Trident
The Apollo SDD and the Hikari EBSD camera are fully compatible with EDAX's integrated materials characterization systems. EDAX offers integrated systems employing EDS, EBSD and/or WDS for advanced chemical and structural analysis. These systems include the Pegasus, Neptune and Trident .
 
 

 

 

  










 

 

 

 

 

 

 

 

 

 

                                              

                                                                                     
 
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