home
China    Japan    ametek.com    Home    Contact Us    Careers               
PRODUCT LINES
X-ray Microanalysis
TSL Crystallography
Integrated X-ray and EBSD
Micro-EDXRF
New Products

Technologies & Applications

 
Integrated Materials Characterization


pegasus
Pegasus: Integrated EDS and EBSD

To completely understand a material, whether it be naturally occurring or man-made, the scientist needs to determine the relationships between its physical properties, morphology, chemistry and crystallography.

The Pegasus system enables the simultaneous collection of EDS (chemistry) and EBSD (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.

      ... more information
Trident
Trident: EDS, EBSD and WDS

Scientists have long recognized the need to determine the relationship between physical properties, morphology, chemistry and crystal structure for virtually any man-made or naturally occurring materials. In many studies it is becoming increasingly important to pursue the investigation of composition and structure on a micro-scale. Utilizing an electron microscope, the scientist has a number of techniques at their disposal, including EDS, EBSD and WDS.

The Trident system offers the unique combination of Genesis EDS X-ray microanalysis, LambdaSpec WDS and TSL EBSD in a single analytical tool, combining the latest in technology for all three techniques. With the Trident system, the need to compromise the performance of one tool in order to optimize the performance of another, is drastically reduced or eliminated, depending on the SEM chamber configuration.

          ... more information
Neptune small
Neptune - Seamless Integration of EDS and WDS

The combination of EDS and WDS provides the materials scientist with a better understanding of the chemical nature of their products and materials. 

The Neptune seamlessly combines the latest technology EDS detector (Si(Li) or SDD) with the next generation of WDS system (LambdaSpec) controlled via a single user-interface for advanced X-ray microanalysis.

        ... more information
 
Overview Press Releases and Trade Shows Services & Support Literature Our Products Contact Sales Our Locations Related Web Sites Privacy Policy Trademarks Map