Microanalysis of Particles: MAS Spring 2009 Topical Conference (April 20-23, 2009) 
Particles are the root cause of many industrial, environmental, and national security issues –contaminants, flaws in emulsions or coatings, thin film inconsistencies, fabrication failures, mysterious powders and the like.  Characterizing particles is a microanalyticalchallenge that can often be best accomplished using a variety of complementary microanalysis techniques, provided one understands the strengths and weaknesses of each.  This conference is designed for those seeking to increase their knowledge of particle characterization, whether they be experienced analysts, newcomers to the field, or students.  Attendees will learn practical tips through lectures, demonstrations, posters and discussions.  Techniques covered include EDS, WDS, AEM, SIMS, ESCA, CL, XRD, synchrotron XRF, andsimulation. The meeting program will include invited platform presentations,contributed poster presentations, focus-group breakout sessions, and laboratory demonstrations. MAS Flyer

1st EDAX EBSD German User Group Meeting (4-5 June 2007)

Howe Medal Award to EDAX TSL Users

Eagle micro-XRF Elemental Analysis Features on CSI

2nd EDAX EBSD UK User Group Meeting (15 November 2006)