2008
Vol 6. No.3  (1.28 KB)- Articles include: EDAX Introduces the New Orbis Micro-XRF Spectrometer, System Automation - Making the Genesis System Work for You, Resolving EDS Overlaps Using WDS

Vol 6. No.2  (1.38 KB)- Articles include: EDAX Introduces the Genesis Apex System, EDAX Introduces the DigiView IV EBSD Detector, Standardless Quantification, Al 7075 Carabiner Analysis

Vol 6. No.1  (1.31 KB)- Articles include: The Right Silicon Drift Detector for the Right Application, Creating User Palettes for Eagle XRF Maps, Characterizing Plastic Deformation with OIM^TM,

2007 
Vol 5. No.4  (1.41 KB)- Articles include: EDAX Introduces Genesis X-ray Microanalysis Software Version 5.2, Eagle III Micro-XRF: Elemental Imaging Analysis, EDAX Introduces a New Tool for the Analysis of Microstructures

Vol 5. No.3  (1.44 KB)- Articles include: Apollo 40 SDD - The SDD with Superior Light Element Performance, Eagle Vision Software (SW) Version 5.0 Release and OIM^TM Software Version 5.2 Release

Vol 5. No.2 (1.094 KB)- Articles include: EBSD vs. XRD Texture Analysis, Eagle Micro X-ray Fluorescence Analysis of Polycrystalline Diamond Compacts, and Attaining High Count Rates and X-ray Mapping with the SDD

Vol 5. No.1 (996 KB)- Articles include: Introducing the Apollo Series Silicon Drift Detector (SDD), Rodrigo Rubiano Joins EDAX as Division Vice President and Business Unit Manager, Eagle III Micro-XRF: Forensic Applications, and OIM^TM 3D Visualization Software

2006
Vol 4. No.1 (2.2 MB)- Articles include: Results with Confidence with HPD, ViP and Element Detective, SpecMap Viewer Features, Eagle Micro-XRF Analysis of Sapphires, and Forward Scatter Detector

Vol.4 No.2 (2.3 MB)- Articles include: EDAX Joins AMETEK's Materials Analysis Division, Results with  Confidence with Multi Phase and Phase Cluster, Eagle Micro XRF System - Spectral Utilities RGB Mixer for Mapping, and QuickGen Tool Bar

Vol.4 No.3 (1.1 MB)- Articles include: EDAX Introduces Hikari EBSD Detector, An Introduction to Automated Particle Analysis, and TEXS Sensitivities and Resolutions

2005
Vol.3 No.1 (1.3 MB)- Articles include: EDAX-TSL Awarded Patent for ChI-Scan Technology, New Features in Genesis v. 4.5 Release, and Building Structure Files from Atomic Position Data

Vol.3 No.2 (1006 KB)- Articles include: Create Quant Maps from SpecMap Data Sets, EDAX Receives Patent for Fundamental Parameter Quantification, and OIM DC 4.5 Offers Exciting New Features in Data Collection

Vol.3 No.3 (2.2 MB)- Articles include: Eagle Micro-EDXRF Imaging of the Archimedes Palimpsest, EDAX Signs an Agreement with xk Inc. to Sell and Support Slice Application, Eagle III Micro XRF Elemental Analyzer Featured on CSI:Miami, and In-Situ OIM Experiments

Vol.3 No.4 (2.2 MB)- Articles include: An Evaluation of Improvements in WDS for the SEM using the PBS, EDAX Genesis Particle Analysis Training, EDAX Introduces Primary Beam Filter System for the Eagle Micro-XRF System, Award Winning Research using EDAX OIM Software, and Pattern Center Calibration in OIM