EDAX is the global leader in Energy Dispersive X-ray Microanalysis, Electron Backscatter Diffraction and Micro X-ray Fluorescence systems. EDAX manufactures, markets and services high-quality products and systems for leading companies in semiconductors, metals, and geological, biological, material and ceramics markets.

Since its founding in 1962, EDAX has utilized its knowledge and expertise to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electric motors with annualized sales of more than $1.8 billion.

Some landmark events that portray EDAX's commitment to maintaining a technology leadership position include:

2008

Introduction of the Orbis Micro-XRF Spectrometer

Introduction of the Apex X-ray Microanalysis System

Introduction of the DigiView IV Electron Backscatter Diffraction Detector

Release of EXpert ID Revolutionary Element Identification Software Available within Genesis

2007

Introduction of the Apollo Silicon Drift Detector Series

2006

EDAX and SPECTRO Analytical Instruments become Business Units within the new AMETEK Materials Analysis Division.

Introduction of Hikari high speed EBSD detector

Introduction of OIM^TM 3D Data Collection and Processing Tool

Introduction of TEXS HP wavelength dispersive X-ray spectrometer

EDAX enters into agreement with xk, Inc. to market Spectral Library Identification and Classification Explorer (SLICE).

Introduction of the Eagle III XPL automated filter option

Introduction of DigiView III CCD Camera

Introduction of Trident three-in-one analysis tool Combines EDS, EBSD and WDS

Introduction of Neptune; complimentary union of EDS and WDS for accurate X-ray microanalysis

Release of Element Detective within Genesis
 

Inroduction of the third generation Eagle µ-Probe micro-focus XRF

Release of thin coating measurement software for the Eagle

Introduction of DigiView II firewire CCD Camera

Release of Phase Cluster Analysis software

Introduction of Pegasus; simultaneous data acquisition optimizing EDS and EBSD

Introduction of three new detectors for microanalysis: the CryoSpec Si(Li) LN2 Free detector, the LambdaSpec Wavelength Dispersive detector and the MegaSpec Silicon Drift Detector.

Release of ChI-Scan software to incorporate elemental composition into the indexing process in EBSD

EDAX celebrates its 40th anniversary! EDAX achieves re-certification to the ISO9001:2000 standard

AMETEK Inc. acquires EDAX Inc.

Introduction of Genesis EDS Software, setting a new standard for overall ease of use, while maintaining flexibility and power.

Introduction of DigiView high-speed, high resolution CCD Camera, the first fully digital EBSD camera

Release of ViP software, a unique quant routine which take into account and corrects for beam scattering that occurs while working in low vacuum, variable pressure SEM conditions.

EDAX acquires TexSEM Laboratories (TSL), the industry leader in Electron Backscatter Diffraction analysis.

Introduction of Automated Crystallography for the TEM (ACT)

Introduction of Delphi, an integrated EBSD/EDS phase identification product

Introduction of the Falcon EDS system; providing economy and perfomance

Introduction of the EAGLE µ-Probe; a new generation of micro-focus XRF

Introduction of the OIM™ EBSD System on PC platform

First simultaneous OIM™/EDS scan

Introduction of the Phoenix - the first Windows-NT based EDS system

Introduction of Sapphire detectors series; providing the best standard resolution of any EDS detector

Introduction of the DX PRIME, a PC Windows-95 based EDS system

Introduction of the CryoSpec liquid nitrogen free detector

TexSEM Laboratories (TSL) founded by the OIM™ development team offers the first commercially available fully automated EBSD System

Introduction of the DX-95 XRF system 

ISO 9001 certification

Introduction of DX-4, the world's first and most popular Windows based EDS system

Introduction of EDAX's unique compact detecting unit (CDU)

Introduction of the first fully automated EBSD system (OIM™)

Introduction of the PV9800 EDS X-ray microanalysis system.

Introduction of the PV9900 EDS X-ray microanalysis system.

First commercially available EBSD System (developed by the forerunner to TSL)

First computer aided Electron Backscatter Diffraction (EBSD) System developed at Bristol University by Dr. David Dingley

Introduction of the PV9500 XRF System

Introduction of the PV9100 EDS X-ray microanalysis system

Nuclear Diodes becomes EDAX International, Inc.

Introduction of the ECON, the first windowless detector

Introduction of Nuclear Diodes 505 - the first commercially available X-ray system for electron microscope applications

Introduction of LN₂-cooled GeLi detectors

Company founded under the name Nuclear Diodes